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Common Mode dV/dt Response and Rejection of Transients

In current sensing applications, there can be significant voltage transients if the voltage waveform has some switching in it, like a PWM signal. There are two ways used to solve this problem. The first is to use a capacitive shield integrated into the sensor die assembly above the lead frame loop. This capacitive shield stops the high dV/dT transients from passing into the signal chain and output signal. The second is to use a conductive shield across the face of the device and connect it to the ground, so that the presence of a high dV/dt events on the device conductor will shunt the resulting capacitively coupled energy. The result is a magnetic field signal, void of electrical coupling between the lead frame and the sensor IC. This results in excellent immunity to both common mode changes as well as voltage transients, enabling direct measurement of DC or low frequency AC signals. Shunt-based solutions typically have a lower dV/dT capability ( >1 µs vs <1 µs) and settle more slowly than magnetic sensors, which make them less appealing for high-switching current sensing applications like in-line PWM often seen in motor control and switched-mode power supply applications.

PTM Published on: 2021-03-01