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During use, oscillators may experience random vibrations ranging from a few hertz to a few kHz and this can increase broadband phase noise. To test the performance of various oscillators, tests were conducted according to MIL-STD-883H, Method 2026 – the standard most applicable to electronic components. Tests were conducted for both random and sinusoidal vibration. Phase noise was measured with and without random vibration for each oscillator and the values of integrated phase jitter was calculated from 15 Hz to 10 kHz. For sinusoidal vibration, peak acceleration was 4 g for each sinusoidal vibration frequency (15, 30, 60, 100, 300, 600, 1000, and 2000 Hz). Each sweep of the vibration frequency took about fifteen to twenty minutes, and the dwell time at each frequency point was about one minute. The tests were repeated in the x, y, and z directions with reference to device pin 1 mark on the package and orientations as shown.
